NEWS!!

★狂賀汪大暉教授專書篇章於 2014 發表

New book chapter publication - springer, 2014, ISBN 978 - 1 - 4614 - 7909 - 3

Chapter 3  "Statistical Characterization of BTI-induced High-k Dielectric Traps in Nanoscale Transistors" in a book "Bias Temperature Instability for Devices and Circuits", ISBN 978-1-4614-7909-3, 2014

★狂賀本實驗室獲 2011 IEDM國際頂尖會議一篇

★狂賀汪大暉教授擔任Journal of Computational Electronics之Associate Editor (2010-present)

★狂賀本實驗室獲 2009 IEDM國際頂尖會議一篇

★狂賀汪大暉教授擔任IEEE Electron Device Letters之Editor (2008-present)

★狂賀本實驗室獲 2008 IEDM國際頂尖會議一篇

★狂賀本實驗室獲 2007 IEDM國際頂尖會議二篇

★狂賀詹前泰學長獲得2005 Symposium on VLSI Technolgy (Kyoto) 最佳學生論文獎、飛利浦領袖獎學金、TSMC Student Research Award